1234567891011121314151617181920212223242526272829303132333435363738394041424344454647484950515253545556575859606162636465666768 |
- #ifndef _SDL_test_harness_h
- #define _SDL_test_harness_h
- #include "begin_code.h"
- #ifdef __cplusplus
- extern "C" {
- #endif
- //! Definitions for test case structures
- #define TEST_ENABLED 1
- #define TEST_DISABLED 0
- //! Definition of all the possible test return values of the test case method
- #define TEST_ABORTED -1
- #define TEST_STARTED 0
- #define TEST_COMPLETED 1
- #define TEST_SKIPPED 2
- //! Definition of all the possible test results for the harness
- #define TEST_RESULT_PASSED 0
- #define TEST_RESULT_FAILED 1
- #define TEST_RESULT_NO_ASSERT 2
- #define TEST_RESULT_SKIPPED 3
- #define TEST_RESULT_SETUP_FAILURE 4
- //!< Function pointer to a test case setup function (run before every test)
- typedef void (*SDLTest_TestCaseSetUpFp)(void *arg);
- //!< Function pointer to a test case function
- typedef int (*SDLTest_TestCaseFp)(void *arg);
- //!< Function pointer to a test case teardown function (run after every test)
- typedef void (*SDLTest_TestCaseTearDownFp)(void *arg);
- typedef struct SDLTest_TestCaseReference {
- SDLTest_TestCaseFp testCase;
- char *name;
- char *description;
- int enabled;
- } SDLTest_TestCaseReference;
- typedef struct SDLTest_TestSuiteReference {
- char *name;
- SDLTest_TestCaseSetUpFp testSetUp;
- const SDLTest_TestCaseReference **testCases;
- SDLTest_TestCaseTearDownFp testTearDown;
- } SDLTest_TestSuiteReference;
- int SDLTest_RunSuites(SDLTest_TestSuiteReference *testSuites[], const char *userRunSeed, Uint64 userExecKey, const char *filter, int testIterations);
- #ifdef __cplusplus
- }
- #endif
- #include "close_code.h"
- #endif
|