i40e_diag.c 4.7 KB

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  1. /*******************************************************************************
  2. *
  3. * Intel Ethernet Controller XL710 Family Linux Driver
  4. * Copyright(c) 2013 - 2014 Intel Corporation.
  5. *
  6. * This program is free software; you can redistribute it and/or modify it
  7. * under the terms and conditions of the GNU General Public License,
  8. * version 2, as published by the Free Software Foundation.
  9. *
  10. * This program is distributed in the hope it will be useful, but WITHOUT
  11. * ANY WARRANTY; without even the implied warranty of MERCHANTABILITY or
  12. * FITNESS FOR A PARTICULAR PURPOSE. See the GNU General Public License for
  13. * more details.
  14. *
  15. * You should have received a copy of the GNU General Public License along
  16. * with this program. If not, see <http://www.gnu.org/licenses/>.
  17. *
  18. * The full GNU General Public License is included in this distribution in
  19. * the file called "COPYING".
  20. *
  21. * Contact Information:
  22. * e1000-devel Mailing List <e1000-devel@lists.sourceforge.net>
  23. * Intel Corporation, 5200 N.E. Elam Young Parkway, Hillsboro, OR 97124-6497
  24. *
  25. ******************************************************************************/
  26. #include "i40e_diag.h"
  27. #include "i40e_prototype.h"
  28. /**
  29. * i40e_diag_reg_pattern_test
  30. * @hw: pointer to the hw struct
  31. * @reg: reg to be tested
  32. * @mask: bits to be touched
  33. **/
  34. static i40e_status i40e_diag_reg_pattern_test(struct i40e_hw *hw,
  35. u32 reg, u32 mask)
  36. {
  37. const u32 patterns[] = {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF};
  38. u32 pat, val, orig_val;
  39. int i;
  40. orig_val = rd32(hw, reg);
  41. for (i = 0; i < ARRAY_SIZE(patterns); i++) {
  42. pat = patterns[i];
  43. wr32(hw, reg, (pat & mask));
  44. val = rd32(hw, reg);
  45. if ((val & mask) != (pat & mask)) {
  46. i40e_debug(hw, I40E_DEBUG_DIAG,
  47. "%s: reg pattern test failed - reg 0x%08x pat 0x%08x val 0x%08x\n",
  48. __func__, reg, pat, val);
  49. return I40E_ERR_DIAG_TEST_FAILED;
  50. }
  51. }
  52. wr32(hw, reg, orig_val);
  53. val = rd32(hw, reg);
  54. if (val != orig_val) {
  55. i40e_debug(hw, I40E_DEBUG_DIAG,
  56. "%s: reg restore test failed - reg 0x%08x orig_val 0x%08x val 0x%08x\n",
  57. __func__, reg, orig_val, val);
  58. return I40E_ERR_DIAG_TEST_FAILED;
  59. }
  60. return 0;
  61. }
  62. struct i40e_diag_reg_test_info i40e_reg_list[] = {
  63. /* offset mask elements stride */
  64. {I40E_QTX_CTL(0), 0x0000FFBF, 1,
  65. I40E_QTX_CTL(1) - I40E_QTX_CTL(0)},
  66. {I40E_PFINT_ITR0(0), 0x00000FFF, 3,
  67. I40E_PFINT_ITR0(1) - I40E_PFINT_ITR0(0)},
  68. {I40E_PFINT_ITRN(0, 0), 0x00000FFF, 1,
  69. I40E_PFINT_ITRN(0, 1) - I40E_PFINT_ITRN(0, 0)},
  70. {I40E_PFINT_ITRN(1, 0), 0x00000FFF, 1,
  71. I40E_PFINT_ITRN(1, 1) - I40E_PFINT_ITRN(1, 0)},
  72. {I40E_PFINT_ITRN(2, 0), 0x00000FFF, 1,
  73. I40E_PFINT_ITRN(2, 1) - I40E_PFINT_ITRN(2, 0)},
  74. {I40E_PFINT_STAT_CTL0, 0x0000000C, 1, 0},
  75. {I40E_PFINT_LNKLST0, 0x00001FFF, 1, 0},
  76. {I40E_PFINT_LNKLSTN(0), 0x000007FF, 1,
  77. I40E_PFINT_LNKLSTN(1) - I40E_PFINT_LNKLSTN(0)},
  78. {I40E_QINT_TQCTL(0), 0x000000FF, 1,
  79. I40E_QINT_TQCTL(1) - I40E_QINT_TQCTL(0)},
  80. {I40E_QINT_RQCTL(0), 0x000000FF, 1,
  81. I40E_QINT_RQCTL(1) - I40E_QINT_RQCTL(0)},
  82. {I40E_PFINT_ICR0_ENA, 0xF7F20000, 1, 0},
  83. { 0 }
  84. };
  85. /**
  86. * i40e_diag_reg_test
  87. * @hw: pointer to the hw struct
  88. *
  89. * Perform registers diagnostic test
  90. **/
  91. i40e_status i40e_diag_reg_test(struct i40e_hw *hw)
  92. {
  93. i40e_status ret_code = 0;
  94. u32 reg, mask;
  95. u32 i, j;
  96. for (i = 0; i40e_reg_list[i].offset != 0 &&
  97. !ret_code; i++) {
  98. /* set actual reg range for dynamically allocated resources */
  99. if (i40e_reg_list[i].offset == I40E_QTX_CTL(0) &&
  100. hw->func_caps.num_tx_qp != 0)
  101. i40e_reg_list[i].elements = hw->func_caps.num_tx_qp;
  102. if ((i40e_reg_list[i].offset == I40E_PFINT_ITRN(0, 0) ||
  103. i40e_reg_list[i].offset == I40E_PFINT_ITRN(1, 0) ||
  104. i40e_reg_list[i].offset == I40E_PFINT_ITRN(2, 0) ||
  105. i40e_reg_list[i].offset == I40E_QINT_TQCTL(0) ||
  106. i40e_reg_list[i].offset == I40E_QINT_RQCTL(0)) &&
  107. hw->func_caps.num_msix_vectors != 0)
  108. i40e_reg_list[i].elements =
  109. hw->func_caps.num_msix_vectors - 1;
  110. /* test register access */
  111. mask = i40e_reg_list[i].mask;
  112. for (j = 0; j < i40e_reg_list[i].elements && !ret_code; j++) {
  113. reg = i40e_reg_list[i].offset +
  114. (j * i40e_reg_list[i].stride);
  115. ret_code = i40e_diag_reg_pattern_test(hw, reg, mask);
  116. }
  117. }
  118. return ret_code;
  119. }
  120. /**
  121. * i40e_diag_eeprom_test
  122. * @hw: pointer to the hw struct
  123. *
  124. * Perform EEPROM diagnostic test
  125. **/
  126. i40e_status i40e_diag_eeprom_test(struct i40e_hw *hw)
  127. {
  128. i40e_status ret_code;
  129. u16 reg_val;
  130. /* read NVM control word and if NVM valid, validate EEPROM checksum*/
  131. ret_code = i40e_read_nvm_word(hw, I40E_SR_NVM_CONTROL_WORD, &reg_val);
  132. if (!ret_code &&
  133. ((reg_val & I40E_SR_CONTROL_WORD_1_MASK) ==
  134. BIT(I40E_SR_CONTROL_WORD_1_SHIFT)))
  135. return i40e_validate_nvm_checksum(hw, NULL);
  136. else
  137. return I40E_ERR_DIAG_TEST_FAILED;
  138. }